Infrared and Laser Engineering, Volume. 52, Issue 8, 20230126(2023)

Phase unwrapping technology for structured light three-dimensional measurement: A review (invited)

Zonghua Zhang1, Yanling Li1,2, Feng Gao2, Nan Gao1, Zhaozong Meng1, and Xiangqian Jiang2
Author Affiliations
  • 1School of Mechanical Engineering, Hebei University of Technology, Tianjin 300130, China
  • 2Centre for Precision Technology, University of Huddersfield, Huddersfield HD13 DH, UK
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    Figures & Tables(6)
    Gray code encoding and decoding process
    Schematic diagram of the optimal three-frequency selection. (a) Wrapped phase with fringe frequency of 9; (b) Wrapped phase with fringe frequency of 8; (c) Wrapped phase with fringe frequency of 6; (d) Unwrapped phase
    Example of phase unwrapping based on directional parallel mapping[73]
    The diagram of the proposed method by Yin et al[104]
    (a) Flowchart of the proposed method in Ref. [107]; (b) Schematic of CNN1; (c) Schematic of CNN2
    • Table 1. Comparison of typical phase unwrapping methods

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      Table 1. Comparison of typical phase unwrapping methods

      Method classificationTypical methodReferenceNumber of patternsMeasured speed Noise resistanceAccuracy
      TPUPU-GC[33, 36-37, 39, 41] MediumHighHighLow
      MFPU[13, 48, 52, 54-55, 61] HighLowHighHigh
      MWPU[15, 62- 63] HighLowLowMedium
      NTPU[64-66] MediumMediumMediumHigh
      SPUQGPU[68, 70, 73-74, 77, 79] LowHighLowLow
      BCPU[84, 87] LowHighHighLow
      PU-DL PhaseNet[97-98] MediumHighMediumMedium
      TriNet[103] MediumHighHighMedium
      MCDL[104] LowHighMediumHigh
      BNN[109] LowHighMediumMedium
      DL-TPU[104-106] MediumHighHighHigh
      DCFPP[113] LowHighMediumHigh
      MFFN[115] LowHighMediumHigh
      LPTPU-DL[116] LowHighMediumHigh
      U-DL[117] LowHighMediumHigh
      OPU T-SBE[120] MediumMediumMediumMedium
      GCPU[123-124] MediumHighMediumHigh
      PCPU[126] LowHighLowMedium
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    Zonghua Zhang, Yanling Li, Feng Gao, Nan Gao, Zhaozong Meng, Xiangqian Jiang. Phase unwrapping technology for structured light three-dimensional measurement: A review (invited)[J]. Infrared and Laser Engineering, 2023, 52(8): 20230126

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    Paper Information

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    Received: Mar. 9, 2023

    Accepted: Mar. 30, 2023

    Published Online: Oct. 19, 2023

    The Author Email:

    DOI:10.3788/IRLA20230126

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