Fig. 1. Dynamic shearography measurement system based on slit diaphragm^[26]

Fig. 2. Spatial phase-shift shearography system based on adjustable apertures^[28]

Fig. 3. Spatial phase-shift measurement based on micro-polarization arrays^[30]. (a) Schematic of the measurement system; (b) phase maps after spatiotemporal low-pass filtering

Fig. 4. Double imaging Mach-Zehnder space carrier shearing system^[36]

Fig. 5. Multi-directional shearing Mach-Zehnder interference system^[37]

Fig. 6. Schematic of 3D measurement^[41]

Fig. 7. Measurement results^[41]. (a) In-plane horizontal deformation u; (b) in-plane horizontal deformation gradient ∂u/∂x; (c) in-plane vertical deformation v; (d) in-plane vertical deformation gradient ∂v/∂x; (e) out-of-plane deformation w; (f) out-of-plane deformation gradient ∂w/∂x

Fig. 8. Schematic of multiplexing measurement based on polarization technology^[42]

Fig. 9. Shearography system based on spatial light modulator^[44]

Fig. 10. Shearography system based on liquid crystal polarization grating^[49]

Fig. 11. Measurement results for mirror^[65]. (a) Measurement result for out-of-plane deformation; (b) detection result for internal defect