Journal of Applied Optics, Volume. 44, Issue 3, 655(2023)
Emissivity calibration technology for infrared stealth coatings at ambient temperature
Fig. 3. Structure diagram of spectral emissivity calibration device
Fig. 5. Block diagram of infrared detector signal processing module
Fig. 6. Samples of brass, stainless steel (smooth), and stainless steel (rough)
Fig. 7. Measurement results of spectral emissivity for calibration device
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Yuxin YANG, Xuexin WANG, Xu ZHANG, Bing YU, Siwei LI, Yi XIE, Xiaoyu YAN. Emissivity calibration technology for infrared stealth coatings at ambient temperature[J]. Journal of Applied Optics, 2023, 44(3): 655
Category: Research Articles
Received: May. 26, 2022
Accepted: --
Published Online: Jun. 19, 2023
The Author Email: WANG Xuexin (wxx205@163.com)