Journal of Applied Optics, Volume. 44, Issue 3, 655(2023)

Emissivity calibration technology for infrared stealth coatings at ambient temperature

Yuxin YANG... Xuexin WANG*, Xu ZHANG, Bing YU, Siwei LI, Yi XIE and Xiaoyu YAN |Show fewer author(s)
Author Affiliations
  • The First Scale Optical Metrology Station of the Science, Technology and Industry for National Defense, Xi'an Institute of Applied Optics, Xi'an 710065, China
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    Figures & Tables(8)
    Schematic of spectral emissivity measurement
    Schematic of spectral emissivity calibration device
    Structure diagram of spectral emissivity calibration device
    Structure diagram of spectral spectrometer module
    Block diagram of infrared detector signal processing module
    Samples of brass, stainless steel (smooth), and stainless steel (rough)
    Measurement results of spectral emissivity for calibration device
    • Table 1. Repeatability of measurement results for brass samples

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      Table 1. Repeatability of measurement results for brass samples

      波长/μm黄铜发射率测量结果重复性S=1x(εiε¯)2n1
      5.00.150.150.160.150.150.150.002
      8.00.150.140.140.140.150.140.007
      12.00.120.110.120.120.130.120.005
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    Yuxin YANG, Xuexin WANG, Xu ZHANG, Bing YU, Siwei LI, Yi XIE, Xiaoyu YAN. Emissivity calibration technology for infrared stealth coatings at ambient temperature[J]. Journal of Applied Optics, 2023, 44(3): 655

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    Paper Information

    Category: Research Articles

    Received: May. 26, 2022

    Accepted: --

    Published Online: Jun. 19, 2023

    The Author Email: WANG Xuexin (wxx205@163.com)

    DOI:10.5768/JAO202344.0304004

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