Chinese Optics Letters, Volume. 14, Issue 9, 093401(2016)

Full-field x ray nano-imaging system designed and constructed at SSRF

Binggang Feng1,2, Biao Deng1,2、*, Yuqi Ren1, Yudan Wang1, Guohao Du1, Hai Tan1,2, Yanling Xue1, and Tiqiao Xiao1,2
Author Affiliations
  • 1Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201204, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
  • show less
    Cited By

    Article index updated:Feb. 24, 2023

    Citation counts are provided from Web of Science. The counts may vary by service, and are reliant on the availability of their data.
    The article is cited by 9 article(s) from Web of Science.
    Tools

    Get Citation

    Copy Citation Text

    Binggang Feng, Biao Deng, Yuqi Ren, Yudan Wang, Guohao Du, Hai Tan, Yanling Xue, Tiqiao Xiao. Full-field x ray nano-imaging system designed and constructed at SSRF[J]. Chinese Optics Letters, 2016, 14(9): 093401

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: X-ray Optics

    Received: Jun. 5, 2016

    Accepted: Jul. 19, 2016

    Published Online: Aug. 3, 2018

    The Author Email: Biao Deng (dengbiao@sinap.ac.cn)

    DOI:10.3788/COL201614.093401

    Topics