Optics and Precision Engineering, Volume. 21, Issue 4, 858(2013)
Determination of refractive index and thickness of MgF2 film using simulated annealing algorithm
Figures & Tables(0)
Tools
Get Citation
Copy Citation Text
GUO Chun, LI Bin-cheng. Determination of refractive index and thickness of MgF2 film using simulated annealing algorithm[J]. Optics and Precision Engineering, 2013, 21(4): 858
Paper Information
Category:
Received: Dec. 24, 2012
Accepted: --
Published Online: May. 24, 2013
The Author Email: Chun GUO (guochunyouxiang@126.com)
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20