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Infrared and Laser Engineering, Volume. 51, Issue 3, 20210148(2022)

Effectiveness evaluation for double-station passive location based on CCD

Haiyuan Cao... Wei Li, Yimin Lu, Hua Chu and Chaowei Mi |Show fewer author(s)
Author Affiliations
  • Opto-electronics Department, Ordnance Noncommissioned Officers School, Army Engineering University, Wuhan 430075, China
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    AbstractGet PDF(in Chinese)
    Figures&Tables (7)
    Equations (17)
    References (14)
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    Figures & Tables(7)
    Diagram of double-station location based on CCD

    Fig. 1. Diagram of double-station location based on CCD

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    Diagram of reconnoiter by eyes and CCD

    Fig. 2. Diagram of reconnoiter by eyes and CCD

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    Curve of contrast and detection probability with distance

    Fig. 3. Curve of contrast and detection probability with distance

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    Location range of double-station based on CCD

    Fig. 4. Location range of double-station based on CCD

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    Location distance of double-station based on CCD

    Fig. 5. Location distance of double-station based on CCD

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    Mean value and Std. deviation of location error

    Fig. 6. Mean value and Std. deviation of location error

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    • Table 1. Location range and deviation vs. the distance of double station

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      Table 1. Location range and deviation vs. the distance of double station

      Distance between CCD’s/kmMaximum location width/kmMaximum location range/km Mean of location deviation/m Std. of location deviation/m
      2.530.515.890.988.6
      5.028.015.848.258.2
      7.525.515.724.621.5
      10.023.015.623.918.4
      12.520.515.218.815.4
      15.018.014.614.210.5
      17.515.513.914.310.1
      20.013.013.115.610.3
      22.510.512.022.711.2
      25.08.010.827.514.1
      27.55.59.135.424.9
      30.03.06.948.336.2
      32.50.52.9322.3273.5
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    Haiyuan Cao, Wei Li, Yimin Lu, Hua Chu, Chaowei Mi. Effectiveness evaluation for double-station passive location based on CCD[J]. Infrared and Laser Engineering, 2022, 51(3): 20210148

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    Paper Information

    Category: Photoelectric measurement

    Received: Dec. 8, 2021

    Accepted: --

    Published Online: Apr. 8, 2022

    The Author Email:

    DOI:10.3788/IRLA20210148

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology