Opto-Electronic Engineering, Volume. 32, Issue 3, 93(2005)

[in Chinese]

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    [4] [4] CHENG Hui-fang,YAN Hui-ming,SHI Bai-xuan. Foil Thickness Measurement with White Light Interferometer[J]. Chinese Journal of Scientific Instrument, 2003,24(z2):19-20.(in Chinese)

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    Paper Information

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    Received: Jul. 12, 2004

    Accepted: --

    Published Online: Nov. 14, 2007

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