[1] [1] YUN jiang-rao,DAVID A Jackson. Recent progress in fibre optic low-coherence interferometry[J]. Measurement Science and Technology, 1996,7(7):981-999.

[2] [2] LIANG Quan-ting. Physical Optics (2nd ed)[M]. Beijing:Chinese Mechanic Press,1998.(in Chinese)

[3] [3] CHENG jun. Modem Optical Technic[M]. Hangzhou:Zhejiang University Press,1996.(in Chinese)

[4] [4] CHENG Hui-fang,YAN Hui-ming,SHI Bai-xuan. Foil Thickness Measurement with White Light Interferometer[J]. Chinese Journal of Scientific Instrument, 2003,24(z2):19-20.(in Chinese)

[5] [5] SONG Jian-ming,SHI Du-fang. A Fast Alogorithm for Analysis of Interference Fringes[J]. Journal of Huazhong University of Science and Technology,2001,29(6z1):35-37.(in Chinese)

[6] [6] YANG Yu-xiao,XIONG Kai-li,SUN Yan,et al. Study of Nanometer Scale Thickness Testing Method of Film Based On The White-light Interferometry[J]. ACTA PHOTONICA SINICA,2003,32(8):973-976.(in Chinese)

[7] [7] DU Jin-long,PU Shao-bang,TAO Wei. The Auto Fitting Extract Alogorithm for Interference Fringe[J]. Measurement Technique,2002,(9):3-5.(in Chinese)

[8] [8] Draper N R,Smith H. Applied Regression Analysis[M]. WANG Xueren, WEN Zhongling. Chongqing:Chongqing University Press,1991.