Infrared and Laser Engineering, Volume. 51, Issue 6, 20210555(2022)
Experimental study on emissivity setting before precise temperature measurement of SiCp/Al cutting by infrared thermal imager
Figures & Tables(18)
Fig. 2. Difference between measured and actual temperature when the emissivity is 0.3
Fig. 4. Effect of different emissivities on the measured temperature
Fig. 5. Geometric relationship between angle field
Fig. 8. Correction flow of the emissivity seting of infrared thermal imager
Table 1. Main technical parameters of fluke-Ti640 infrared thermal imager
View tableView in ArticleTable 1. Main technical parameters of fluke-Ti640 infrared thermal imager
Project Content Wavelength/µm 7.5−14 Frame rate/Hz 60 Temperature range/℃ −40 − +1200 Accuracy/℃ ±0.1
Table 2. Basic properties of SiCp/Al composite
View tableView in ArticleTable 2. Basic properties of SiCp/Al composite
Parameter 2024Al SiC Thermal conductivity/(W·m−1·K−1） 180 81 Specific heat capacity/(J·kg−1·K−1） 880 427 Volume fraction 55% 45% Density/(kg·m−3) 2.7×103 3.13×103 Poisson ratio 0.34 0.14 Thermal expansion coefficient/K−1 23.6×10−6 4.9×10−6
Table 3. Factorial experiment parameters
View tableView in ArticleTable 3. Factorial experiment parameters
Factor Level α/(°) 0 45 Ra/μm 0.4 1.8 l/mm 250 1500 T/℃ 100 500
Table 4. Orthogonal experimental factors and levels
View tableView in ArticleTable 4. Orthogonal experimental factors and levels
Factor Level Ra/μm 0.4 0.8 1.2 1.6 l/mm 250 750 1250 1500 T/℃ 100 300 500 700
Table 5. Range analysis
Table 6. Analysis of variance
View tableView in ArticleTable 6. Analysis of variance
Factor Q n m F Ra/μm 0.235 3 6 4.64 l/mm 0.239 3 6 0.32 T/℃ 0.058 3 6 112.06
Table 7. Experimental verification results
View tableView in ArticleTable 7. Experimental verification results
Ra /μm l /mm T /℃ Measured value Calculated value Deviation 0.4 250 200 0.29 0.282 2.76% 0.4 250 400 0.29 0.283 2.76% 0.4 250 700 0.74 0.73 1.35%
Table 8. Comparison of temperature measurement results
View tableView in ArticleTable 8. Comparison of temperature measurement results
Ra/ μm l/ mm T/ ℃ Set emissivity temperature/℃ Formula predicted value/℃ Deviation 0.4 250 200 200.59 205.08 2.24% 0.4 250 400 403.03 412.43 2.33% 0.4 250 700 707.5 714.26 0.96%
Table 9. Cutting experiment design
View tableView in ArticleTable 9. Cutting experiment design
v /m·min−1 l /mm Ra /μm Original setting emissivity Original temperature /℃ 1 40 1000 0. 63 0.3 223.18 2 80 1000 0. 536 0.3 356.7 3 120 1000 0. 501 0.3 446.3 4 160 1000 0. 53 0.3 313.64 5 200 1000 0. 567 0.3 429.8
Table 10. Comparison of cutting temperature before and after setting emissivity correction
View tableView in ArticleTable 10. Comparison of cutting temperature before and after setting emissivity correction
Setting emissivity Temperature /℃ Deviation Original Corrected Original Corrected 0.3 0.266445 223.18 244.6 9.597634% 0.3 0.262906 356.7 391.5 9.756098% 0.3 0.2719 446.3 478.7 7.259691% 0.3 0.266453 313.64 346.1 10.34945% 0.3 0.267178 429.8 472.7 9.981387%
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Qi Zhang, Guohe Li, Yong Sun, Fei Sun. Experimental study on emissivity setting before precise temperature measurement of SiCp/Al cutting by infrared thermal imager[J]. Infrared and Laser Engineering, 2022, 51(6): 20210555
Paper Information
Category: Infrared technology and application
Received: Jul. 10, 2021
Accepted: --
Published Online: Dec. 20, 2022
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