Fig. 1. Comparator and clock driver PCB test board power module decoupling circuit

Fig. 2. Schematic diagram of pulse current injection experiment configuration

Fig. 3. Injection pulse current waveform

Fig. 4. Output glitch waveforms of a comparator operating at 500 kHz

Fig. 5. Output glitch waveforms of a comparator operating at 1 MHz

Fig. 6. Output glitch waveforms of a comparator operating at 2 MHz

Fig. 7. Output glitch waveform of a comparator operating at 10 MHz

Fig. 8. Variation of Δ and Δ with the amplitude of injection pulse currentΔ与Δ随注入脉冲电流幅值的变化情况

Fig. 9. Variation of Δ with the amplitude of injection pulse current at different operating frequencies不同工作频率下Δ随注入脉冲电流幅值的变化情况

Fig. 10. Clock driver output disturbance waveforms with operating frequency 1 GHz

Fig. 11. Output glitch Δ of the 1 GHz clock driver varies with the amplitude of the injection current pulse工作频率1 GHz时钟驱动器输出扰动Δ随注入电流脉冲幅值变化情况

Fig. 12. Glitch amplitude Δ of the output waveform of clock drivers with different operating frequencies varies with the amplitude of the injected pulse current不同工作频率时钟驱动器输出波形扰动幅度Δ随注入脉冲电流幅值的变化情况

Fig. 13. Comparison of output waveforms of clock drivers at different frequencies