Researching | Method and Experiment for Boresight Monitoring of Laser Reference Cameras

Acta Optica Sinica, Volume. 41, Issue 15, 1512003(2021)

Method and Experiment for Boresight Monitoring of Laser Reference Cameras

Yunhua Zong^*, Weizhi Wang, Yuning Ren, Qinglei Wang, Yan Wang, and Weijun Gao

Author Affiliations

Beijing Institute of Space Mechanics & Electricity, Beijing 100094, China

show less

Abstract Get PDF(in Chinese)

Figures&Tables (9)

References (10)

Paper Information

Figures & Tables(9)

Fig. 1. Boresight monitoring diagram of LRC

Download full size

Fig. 2. Schematic of rotation of LRC boresight around X axis

Download full size

Fig. 3. Schematic of rotation of LRC boresight around Y axis

Download full size

Fig. 4. Experimental system of LRC boresight monitoring

Download full size

Fig. 5. Drift result of LRC boresight around X axis

Download full size

Fig. 6. Drift result of LRC boresight around Y axis

Download full size

Fig. 7. Drift residual errors of LRC boresight around X axis

Download full size

Fig. 8. Drift residual errors of LRC boresight around Y axis

Download full size

Table 1. Validation results for algorithm
View table
Table 1. Validation results for algorithm
$R_{X_{0}}$ /(″) $R_{X_{1}}$ /(″) $R_{X_{2}}$ /(″) ΔR_X /(″)
-21.6 -20.74 -20.91 0.17
-252 -249.67 -249.52 0.15
252 232.30 232.35 0.05

Tools

Get Citation

Copy Citation Text

Yunhua Zong, Weizhi Wang, Yuning Ren, Qinglei Wang, Yan Wang, Weijun Gao. Method and Experiment for Boresight Monitoring of Laser Reference Cameras[J]. Acta Optica Sinica, 2021, 41(15): 1512003

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Mar. 18, 2021

Accepted: May. 7, 2021

Published Online: Aug. 11, 2021

The Author Email: Zong Yunhua (zyh92700@126.com)

DOI:10.3788/AOS202141.1512003

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology