Optics and Precision Engineering, Volume. 15, Issue 4, 492(2007)

Mathematical model ofcontacting aspheric surface contour measurement

[in Chinese]... [in Chinese], [in Chinese], [in Chinese] and [in Chinese] |Show fewer author(s)
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    References(5)

    [2] [2] D L,ZHANG ZH Y,ZHANG X J,et al..Computer controlled polishing technology for middle or

    [4] [4] R G,ZHENG L G,XUE D L,et al..Calibration method for projection distortion in

    [5] [5] interferometric testing high order and off-axis aspheric surface with big

    [7] [7] H Y,ZHANG X J.Research on computer controlled polishing technology of (ψ)124 mm aspheric

    [8] [8] Chinese)

    CLP Journals

    [1] CUI Chang-cai, ZHANG Geng-pei, ZHANG Bin, ZHANG Qian. Application of wavelet filtering and singularity analysis to evaluation of surface roughness[J]. Optics and Precision Engineering, 2009, 17(9): 2255

    [2] QIU Gu-feng, YU Jing-chi, HUANG Qi-tai, NI Ying, WANG Yi. Mathematical model of contacting freeform surface contour measurement[J]. Optics and Precision Engineering, 2013, 21(11): 2813

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Mathematical model ofcontacting aspheric surface contour measurement[J]. Optics and Precision Engineering, 2007, 15(4): 492

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    Paper Information

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    Received: Dec. 22, 2006

    Accepted: --

    Published Online: Feb. 18, 2008

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