[1] [1] ULM G.Radiometry with synchrotron radiation[J].Metrologia,2003,40(1):s101-S106.

[2] [2] G(O)RNER W,HENTSCHEL M P,M(U)LLER B R,et al..BAMline:the first hard X-ray beamline at BESSY II[J].Nucl.Instr.and Meth A,2001,467:703-706.

[3] [3] THORNAGEL R,KLEIN R,ULM G.The electron storage ring BESSY II as a primary source standard from the visible to the X-ray range[J].Metrologia,2001,38(5):385-389.

[4] [4] KLEIN R,BRANDT G,CIBIK L,et al..A superconducting wavelength shifter as primary radiometric source standard in the X-ray range[J].Nucl.Instr.and Meth.A,2007,580(3):1536-1543.

[5] [5] SUBBOTIN A N,GAGANOV V V,KALUTSKY A V,et al..Absolute calibration of X-ray semiconductor detectors against synchrotron radiation of the VEPP-3 storage ring[J].Metrologia,2000,37(5):497-500.

[6] [6] KRUMREY M,SCHOLZE F,ULM G.High-accuracy X-ray detector calibration at PTB[J].SPIE,2004,5501:277-285.

[7] [7] KRUMREY M,GERLACH M.SCHOLZE F,et al..Calibration and characterization of semiconductor X-ray detectors with synchrotron radiation[J].Nucl.Instr.and Meth.A,2006,568:364-368.

[8] [8] AGOSTINELLI S,ALLISON J,AMAKO K,et al..Geant4-a simulation toolkit[J].Nucl.Instr.and Meth.A,2003,506(3)1250-303.

[9] [9] WEISSKOPF M C,TANANBAUM H D,VAN SPEYBROECK L P,et al..Chandra X-ray Observatory (CXO):overview[J].SPIE,2000,4012:2-16.

[10] [10] JANSEN F,LUMB D,ALTIERI B,et al..XMM-Newton Observatory.I.The spacecraft and operation[J].Astron.Astrophys.,2001,365:L1-L6.

[11] [11] GERLACH M,KRUMREY M,CIBIK M,et al..[J].Nucl.Instr.and Meth.A,2007,580:218-221.

[12] [12] TROUSSEL P.Commissariat a lenergie Atomique(CEA),France,private communication[Z].

[13] [13] KRUMREY M,ULM G.High-accuracy detector calibration at the PTB four-crystal monochromator beamline[J].Nucl.Instr.and Meth.At 2001,467:1175-1178.

[14] [14] ARP U,FRIEDMAN R,FURST M L,et al..SURF Ⅲ-an improved storage ring for radiometry[J].Metrologia,2000,37(5):357-360.

[15] [15] ZAMA Z,SAITO L.Improvement of the beamline for calibration of the transfer standard in the UV and VUV regions[J].Metrologia,2003,40(1):S115-S119.