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Chinese Optics Letters, Volume. 16, Issue 1, 012301(2018)

Simple Raman scattering sensor integrated with a metallic planar optical waveguide: effective modulation via minor structural adjustment

Yan Lu1, Xuefen Kan2,3, Tian Xu1、*, Jinghuai Fang1, Meng Wang1, Cheng Yin2,3, and Xianfeng Chen2
Author Affiliations
  • 1Physics Department, Nantong University, Nantong 226007, China
  • 2The State Key Laboratory on Fiber Optic Local Area Communication Networks and Advanced Optical Communication Systems, Department of Physics and Astronomy, Shanghai JiaoTong University, Shanghai 200240, China
  • 3College of Internet of Things Engineering, Hohai University, Changzhou 213022, China
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    Schematic diagram of the MCOW structure.

    Fig. 1. Schematic diagram of the MCOW structure.

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    (Color online) ATR spectra of TE and TM polarization of an MCOW chip. The wavelength is 785 nm, and the dielectric constant of silver, PMMA, and glass is taken as εAg=−26+1.5i, εPMMA=2.21, and εglass=2.28, respectively.

    Fig. 2. (Color online) ATR spectra of TE and TM polarization of an MCOW chip. The wavelength is 785 nm, and the dielectric constant of silver, PMMA, and glass is taken as εAg=−26+1.5i, εPMMA=2.21, and εglass=2.28, respectively.

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    Electric field distribution of a single mode in different thicknesses of PMMA films. (a) 0.5, (b) 0.8, (c) 1.0, (d) 1.3, and (e) 1.5 μm.

    Fig. 3. Electric field distribution of a single mode in different thicknesses of PMMA films. (a) 0.5, (b) 0.8, (c) 1.0, (d) 1.3, and (e) 1.5 μm.

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    (a) Experimental setup for reflectivity detection; (b) the reflection spectra of the MCOW chip with 7 μm PMMA film.

    Fig. 4. (a) Experimental setup for reflectivity detection; (b) the reflection spectra of the MCOW chip with 7 μm PMMA film.

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    Raman spectra of CuPc obtained via MCOW with five different PMMA film thicknesses: 7, 11, 16, 19, and 23 μm, respectively.

    Fig. 5. Raman spectra of CuPc obtained via MCOW with five different PMMA film thicknesses: 7, 11, 16, 19, and 23 μm, respectively.

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    • Table 1. Characteristic Peak Intensity of CuPc in Different Thickness PMMA Films

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      Table 1. Characteristic Peak Intensity of CuPc in Different Thickness PMMA Films

      The Intensity Variations of Characteristic Peak Versus the Thickness of PMMA Film
      d/μm1345 cm−1/a.u.1466  cm−1/a.u.1558  cm−1/a.u.
      7565213729
      119362951070
      1616385942464
      19418513315962
      23666122819477
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    Yan Lu, Xuefen Kan, Tian Xu, Jinghuai Fang, Meng Wang, Cheng Yin, Xianfeng Chen, "Simple Raman scattering sensor integrated with a metallic planar optical waveguide: effective modulation via minor structural adjustment," Chin.Opt.Lett. 16, 012301 (2018)

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    Paper Information

    Category: Optical devices

    Received: Sep. 29, 2017

    Accepted: Nov. 23, 2017

    Published Online: Jul. 17, 2018

    The Author Email: Tian Xu (xutian@ntu.edu.cn)

    DOI:10.3788/COL201816.012301

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology