Semiconductor Optoelectronics, Volume. 44, Issue 1, 8(2023)

A High Dynamic Range CMOS Image Sensor Based on Time Domain

JIN Shaolei1...2,3, CHEN Yongping1,* and CHEN Shijun1 |Show fewer author(s)
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    References(8)

    [1] [1] Solhusvik J, Kuang J T, Lin Z Q, et al. A comparison of high dynamic range CIS technologies for automotive applications[C]// International Image Sensor Workshop, 2013.

    [2] [2] Park J H, Mase M, Kawahito S, et al. A 142dB dynamic range CMOS image sensor with multiple exposure time signals[C]// 2005 IEEE Asian Solid-State Circuits Conf., 2005: 85-88.

    [3] [3] Mase M, Kawahito S, Sasaki M, et al. A wide dynamic range CMOS image sensor with multiple exposure-time signal outputs and 12-bit column-parallel cyclic AD converters[J]. IEEE J. of Solid State Circuits, 2005, 40(12): 2787-2795.

    [4] [4] Kavadias S, Dierickx B, Scheffer D, et al. A logarithmic-response CMOS image sensor with on-chip calibration[J]. IEEE J. Solid-State Circuits, 2000(8): 1146-1152.

    [5] [5] Vatteroni M, Valdastri P, Sartori A, et al. Linear-logarithmic CMOS pixel with tunable dynamic range[J]. IEEE Trans. on Electron Devices, 2011, 58(4): 1108-1115.

    [6] [6] Chou W F, Yeh S F, Chiu C F, et al. A linear-logarithmic CMOS image sensor with pixel-FPN reduction and tunable response curve[J]. IEEE Sensors J., 2014, 14(5): 1625-1632.

    [9] [9] Mutlu A A, Rahman M. Two-dimensional analytical model for drain induced barrier lowering (DIBL) in short channel MOSFETs[C]// Proc. of the IEEE Southeastcon Confer. 2000, 2000: 340-344.

    [10] [10] Tsividis Y P. Accurate analysis of temperature effects in characteristics with application to bandgap reference sources[J]. IEEE J. of Solid-State Circuits, 1980, 15(6): 1076-1084.

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    JIN Shaolei, CHEN Yongping, CHEN Shijun. A High Dynamic Range CMOS Image Sensor Based on Time Domain[J]. Semiconductor Optoelectronics, 2023, 44(1): 8

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    Paper Information

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    Received: Nov. 2, 2022

    Accepted: --

    Published Online: Apr. 7, 2023

    The Author Email: Yongping CHEN (chen_yp@mail.sitp.ac.cn)

    DOI:10.16818/j.issn1001-5868.2022110203

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