Acta Optica Sinica, Volume. 33, Issue 10, 1031001(2013)
Spectroscopic Ellipsometry Characterization of Hydrogenated Amorphous Silicon Thin Film
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He Jian, Li Wei, Xu Rui, Guo Anran, Qi Kangcheng, Jiang Yadong. Spectroscopic Ellipsometry Characterization of Hydrogenated Amorphous Silicon Thin Film[J]. Acta Optica Sinica, 2013, 33(10): 1031001
Category: Thin Films
Received: Apr. 8, 2013
Accepted: --
Published Online: Sep. 6, 2013
The Author Email: Jian He (drhejian@gmail.com)