Optical Instruments, Volume. 35, Issue 1, 12(2013)

Schmidt prism polarization properties of the Mueller matrix method for analyzing and measuring

LU Jinjun and ZHU Weibing
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  • [in Chinese]
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    References(7)

    [1] [1] LU J J, YUAN Q, SUN X P, et al.Research of the polarization aberration on Smith prism[J].Physics Procedia, 2011, 19:447-455.

    [5] [5] ICHMOTO K, SHINODA K, YAMAMOTO T, et al.Photopolarimetric measurement system of mueller matrix with dual rotating waveplates[J].Publ Natl Astron Obs Japan, 2006, 9:11-19.

    [8] [8] KYEA J, MCINTYREB G, NORIHIROC Y, et al.Polarization aberration analysis in optical lithography systems[J].Optical Microlithography, 2006, 36(7):1553-1559.

    [10] [10] CHENAULT D B, PEZZANITI J L, CHIPMAN R A.Mueller matrix algorithms[J].Polarization Analysis and Measurement, 1992, 1746:231-246.

    [11] [11] PEZZANITI J L, CHIPMAN R A.Mueller matrix imaging polarimetry[J].Optical Engineering, 1995, 34(6):1558-1568.

    [12] [12] YUN G, CRABTREE K, CHIPMAN R A.Three-dimensional polarization ray tracing and diattenuation calculation[J].SPIE OSA, 2010, 7652:76521X1-76521X7.

    [13] [13] YUN G, CHIPMAN R A.Three-dimensional polarization ray tracing, retardance[J].SPIE OSA, 2010, 7652:76521W1-76521W7.

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    LU Jinjun, ZHU Weibing. Schmidt prism polarization properties of the Mueller matrix method for analyzing and measuring[J]. Optical Instruments, 2013, 35(1): 12

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    Paper Information

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    Received: Jul. 20, 2012

    Accepted: --

    Published Online: Mar. 27, 2013

    The Author Email:

    DOI:10.3969/j.issn.1005-5630.2013.01.003

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