The polarization aberration of the Schmidt prism resulted in the decline in the quality of imaging, as a result, the quantitative detection of the Schmidt prism to correct the polarization aberration has become a top priority. Mueller matrix method can be used not only for the analysis of the polarization properties of the Schmidt prism, but also as the characterization and detected object of the Schmidt prism′s polarization properties. Dual rotating retarder configuration is applied, whose incident is modulated by synchronously rotating two quarter waveplates. And Schmidt prism′s matrix elements are calculated by Fourier series. According to the calculation and analysis and experiment of the Mueller matrix element, the obtained retardance and diattenuation in the two different ways are obviously different from each other. The diattenuation and retardance have been employed to characterize the polarization aberration of the Schmidt prism, and they are from the Mueller matrix directly. Obviously, Mueller matrix method is intuitive and convenient both in theory analysis and experiment.