Automatic CCD Full-well Test System and Its Application in Camera Development

Fang LIN; Wenqing LIU; Yu WANG; Zhen CHANG; Fuqi SI

doi:10.3788/gzxb20235211.1111001

Acta Photonica Sinica, Volume. 52, Issue 11, 1111001(2023)

Automatic CCD Full-well Test System and Its Application in Camera Development

Fang LIN1...2, Wenqing LIU1,2,*, Yu WANG3, Zhen CHANG2 and Fuqi SI2 |Show fewer author(s)

¹School of Environmental Science and Optoelectronic Technology，University of Science and Technology of China，Hefei 230026，China

²Key Laboratory of Environmental Optical and Technology，Anhui Institute of Optics and Fine Mechanics，Hefei Institutes of Physical Science，Chinese Academy of Sciences，Hefei 230031，China

³Information Materials and Intelligent Sensing Laboratory of Anhui Province，Institutes of Physical Science and Information Technology，Anhui University，Hefei 230039，China

show less

Abstract Get PDF(in Chinese)

Figures & Tables(15)

Fig. 1. Principle of CCD

Download full size

View in Article

Fig. 2. Photon transfer curve

Download full size

View in Article

Fig. 3. Photon transfer curve of shot noise

Download full size

View in Article

Fig. 4. Automatic test platform

Download full size

View in Article

Fig. 5. Remove FPN by subtraction of two flat fields

Download full size

View in Article

Fig. 6. Testing flow of PTC

Download full size

View in Article

Fig. 7. Test platform

Download full size

View in Article

Fig. 8. UI of the testing platform

Download full size

View in Article

Fig. 9. Test result of PTC

Download full size

View in Article

Table 1. Basic parameters of CCD275
View table
View in Article
Table 1. Basic parameters of CCD275
Parameters Value
Pixel size 26 μm×26 μm
Active Pixels（H×V） 1 024×1 024
Peak charge storage ≥700 ke^-/pixel
Maximum readout frequency 5 MHz

Table 2. Line move period of CCD275

View table

View in Article

Table 2. Line move period of CCD275

Symbol	Description	Min	Typ	Max	Unit
	Line move period	800	1 000	/	ns
T_pr	Image/store section pulse ries time（10%~90%）	45	50	/	ns
T_pf	Image/store section pulse fall time（10%~90%）	45	50	/	ns
T_r	Register clock period	/	334	/	ns
T_rr/T_xr	Register/reset pulse rise time（10%~90%）	5	10	15	ns
T_rf/T_xf	Register/reset pulse fall time（10%~90%）	5	10	15	ns
T_wx	Reset pulse width（at 50% levels）	20	25	/	ns

Table 3. Results of different line move period
View table
View in Article
Table 3. Results of different line move period
Transfer time/μs Full well performance/ke^-
1.2 312
1.6 658
2 951
3 951

Table 4. Results of diifferent circuit parameters
View table
View in Article
Table 4. Results of diifferent circuit parameters
No. Transfer voltage high/V Register voltage high/V Overlapping/ns FWC/ ke^-
1 7 7 0 850
2 7 7.5 0 924
3 7 8 0 951
4 7 8.5 0 951

Table 5. Factory test condition
View table
View in Article
Table 5. Factory test condition
Factory test condition Value
Test temperature -40 ℃
Test pressure <10^-5 mbar
Line transfer time 2 μs
Readout frequency 1 MHz

Table 6. Results of factory test and platform test
View table
View in Article
Table 6. Results of factory test and platform test
CCD Factory test Platform test Measurement error
1 942 ke^- 938 ke^- -0.42%
2 951 ke^- 943 ke^- -0.84%
3 956 ke^- 957 ke^- 0.10%
4 966 ke^- 975 ke^- 0.93%

Tools

Get Citation

Copy Citation Text

Fang LIN, Wenqing LIU, Yu WANG, Zhen CHANG, Fuqi SI. Automatic CCD Full-well Test System and Its Application in Camera Development[J]. Acta Photonica Sinica, 2023, 52(11): 1111001

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites