Opto-Electronic Engineering, Volume. 42, Issue 9, 89(2015)
Measurement of Optical Constants for UV Coating Based on Multilayer Film Model by Spectroscopic Ellipsometry
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WU Huili, TANG Yi, BAI Tingzhu, JIANG Yurong, JIANG Jing. Measurement of Optical Constants for UV Coating Based on Multilayer Film Model by Spectroscopic Ellipsometry[J]. Opto-Electronic Engineering, 2015, 42(9): 89
Paper Information
Received: Nov. 3, 2014
Accepted: --
Published Online: Feb. 2, 2016
The Author Email: Huili WU (xiaoli90hou@163.com)
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