Journal of Atmospheric and Environmental Optics, Volume. 18, Issue 2, 141(2023)

Automatic measurement method of target reflectivity at Songshan Remote Sensing Calibration Field

PAN Yan1,2, LI Xin1、*, LI Zhaozhou3, ZHANG Quan1, and ZHANG Yanna1
Author Affiliations
  • 1Key Laboratory of Optical Calibration and Characterization, Anhui Institute of Optics and Fine Mechanics, HFIPS,Chinese Academy of Sciences, Hefei 230031, China
  • 2University of Science and Technology of China, Hefei 230026, China
  • 3China Center for Resources Satellite Data and Application, Beijing 100094, China
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    Figures & Tables(14)
    Aerial view of Songshan Remote Sensing Calibration Field
    Model (a) and picture (b) of automated reflectance monitoring spectrometer
    Model (a) and picture (b) of visible-shortwave infrared hyperspectral irradiance meter
    Verification process of the reflectance accuracy
    Measurement comparison of two methods in Area Ⅰ. (a) Comparison of two reflectance; (b) measurement deviation
    Measurement comparison of two methods in Area Ⅱ. (a) Comparison of two reflectance; (b) measurement deviation
    Measurement comparison of two methods in Area Ⅲ. (a) Comparison of two reflectance; (b) measurement deviation
    All day total irradiance in different bands measured by HIM-002 on October 29, 2019
    All day total-irradiance of HIM-002 in different bands. (a) June 3, 2020; (b) July 27, 2020
    Target reflected radiance data measured by ARM002 at different time
    The changes of reflectance in the Area Ⅱ. (a) In the whole bands; (b) some wavelengths
    The changes of reflectance in the Area Ⅲ. (a) In the whole bands; (b) some wavelengths
    The standard deviation of reflectance in the field. (a) Area Ⅱ; (b) Area Ⅲ
    • Table 1. Main parameters and functions of ARMS and HIM

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      Table 1. Main parameters and functions of ARMS and HIM

      InstrumentARMSHIM
      Spectral range/nm350~1600400~2400

      FWHM

      ≤ 4 nm(@350~950 nm)

      ≤ 15 nm(@950~1600 nm)

      ≤ 4 nm (@400~950 nm)

      ≤ 15 nm (@950~1650 nm)

      ≤ 20 nm (@1650~2400 nm)

      Functions

      1) to automatically measure the reflected

      radiance of surface in a continuous spectrum;

      2) to automatically observe

      in the wild;

      3) the function of self-cleaning

      reference board;

      4) self-calibration based on the

      reference board.

      1) to automatically measure

      the total irradiance;

      2) to automatically measure the

      sky light diffuse irradiance;

      3) to automatically obtain the

      direct solar irradiance;

      4) to automatically obtain the ratio

      between total and diffuse irradiance.

      Data transmission4G4G
      Operating temperature/℃-30~+60-30~+60
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    Yan PAN, Xin LI, Zhaozhou LI, Quan ZHANG, Yanna ZHANG. Automatic measurement method of target reflectivity at Songshan Remote Sensing Calibration Field[J]. Journal of Atmospheric and Environmental Optics, 2023, 18(2): 141

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    Paper Information

    Category:

    Received: Dec. 24, 2020

    Accepted: --

    Published Online: Jul. 7, 2023

    The Author Email: LI Xin (xli@aiofm.ac.cn)

    DOI:10.3969/j.issn.1673-6141.2023.02.006

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