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Journal of Terahertz Science and Electronic Information Technology , Volume. 19, Issue 2, 347(2021)

Design of a general test system for integrated circuit Single Event Effect

YANG Wanwan1,2、*, LIU Hainan1,2, GAO Jiantou1,2, LUO Jiajun1,2, TENG Rui1,2, and HAN Zhengsheng1,2,3
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    YANG Wanwan, LIU Hainan, GAO Jiantou, LUO Jiajun, TENG Rui, HAN Zhengsheng. Design of a general test system for integrated circuit Single Event Effect[J]. Journal of Terahertz Science and Electronic Information Technology , 2021, 19(2): 347

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    Received: Oct. 17, 2019

    Accepted: --

    Published Online: Jul. 16, 2021

    The Author Email: Wanwan YANG (yangwanwan@ime.ac.cn)

    DOI:10.11805/tkyda2019421

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology