Electro-Optic Technology Application, Volume. 30, Issue 4, 5(2015)
Reliability Analysis of 808 nm High Power Semiconductor Laser
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LI Ya-jing, PENG Hai-tao. Reliability Analysis of 808 nm High Power Semiconductor Laser[J]. Electro-Optic Technology Application, 2015, 30(4): 5
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Received: Jun. 9, 2015
Accepted: --
Published Online: Sep. 8, 2015
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