Fig. 1. Schematic diagram of the principle of SPPM and its application.

Fig. 2. Dynamic meta-atom: (a)–(c) structure diagram and geometric parameters; (d) simulated reflection amplitude in the “0,” “1” states; (e) simulated reflection phase in the “0,” “1” states; (f), (g) surface current distribution in the “0,” “1” states.

Fig. 3. Simulation diagram: (a)–(c) distribution diagrams of meta-atom state for different coding sequences; (d)–(f) far-field scattering pattern for theory of different coding sequences; (h)–(i) far-field scattering pattern for simulation of different coding sequences.

Fig. 4. Diagram of the experiment setup: (a) experimental sample; (b) LED array; (c) device connection diagram; (d) diagram of S-parameter experimental measurement devices; (e) diagram of far-field scattering pattern experimental measurement devices.

Fig. 5. Experimental measurement results: (a), (b) S-parameter measurement results; (c), (d) counterclockwise, clockwise measurement results of four beams; (e) measurement result of RCS reduction; (f) measurement result of vortex beam.

Fig. 6. Simulation results: (a) amplitude at different resistance values; (b) phase at different resistance values.

Fig. 7. S-parameter simulation results under different structural parameters: (a), (b) S-parameter simulation results under different l1; (c), (d) S-parameter simulation results under different l2.

Fig. 8. S-parameter simulation results under different device parameters: (a), (b) S-parameter simulation results under different inductances when the capacitance is 0.5 pF; (c), (d) simulation results of S-parameters under different capacitances when the inductance is 0.5 nH.

Fig. 9. Phase distribution and two-dimensional far-field scattering pattern of different EM functions: (a), (b) four beams; (c), (d) RCS reduction; (e), (f) vortex beam.