Terahertz Nondestructive Detection of the Hidden Layer in Multilayer Medium

Xiuwei YANG; Dehai ZHANG; Siyu LIU; Xiangdong LI; Chuanwen XU

doi:10.3788/gzxb20215003.0312001

Acta Photonica Sinica, Volume. 50, Issue 3, 119(2021)

Terahertz Nondestructive Detection of the Hidden Layer in Multilayer Medium

Xiuwei YANG^1,2,3, Dehai ZHANG¹, Siyu LIU^1,2, Xiangdong LI³, and Chuanwen XU³

¹Key Laboratory of Microwave Remote Sensing， National Space Science Center， Chinese Academy of Sciences， Beijing0090， China

²University of Chinese Academy of Sciences， Beijing100049， China

³Key Laboratory of UWB & THz of Shandong Academy of Sciences， Institute of Automation， Qilu University of Technology （Shandong Academy of Sciences）， Jinan25001， China

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Table 1. The sample thickness， refractive index and quantitative error were obtained by genetic algorithm

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Table 1. The sample thickness， refractive index and quantitative error were obtained by genetic algorithm

No.	Method	Thickness/mm	Error/%	Refravtive index	Error/%
1	Mesured value	0.200	1	1.670	0.8
1	Estimated value	0.202	1	1.684	0.8
2	Mesured value	0.200	2.5	1.670	12.8
2	Estimated value	0.205	2.5	1.885	12.8
3	Mesured value	0.200	4	1.670	12.8
3	Estimated value	0.208	4	1.884	12.8
4	Mesured value	0.200	0.15	1.670	1.5
4	Estimated value	0.203	0.15	1.695	1.5
5	Mesured value	0.200	1	1.670	12.7
5	Estimated value	0.202	1	1.882	12.7
6	Mesured value	0.200	1	1.670	0.9
6	Estimated value	0.198	1	1.685	0.9
7	Mesured value	0.200	2	1.670	0.6
7	Estimated value	0.204	2	1.680	0.6
8	Mesured value	0.200	0.5	1.670	0.5
8	Estimated value	0.201	0.5	1.679	0.5

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Xiuwei YANG, Dehai ZHANG, Siyu LIU, Xiangdong LI, Chuanwen XU. Terahertz Nondestructive Detection of the Hidden Layer in Multilayer Medium[J]. Acta Photonica Sinica, 2021, 50(3): 119

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Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Sep. 8, 2020

Accepted: Dec. 9, 2020

Published Online: Jul. 13, 2021

The Author Email:

DOI:10.3788/gzxb20215003.0312001

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology