Infrared and Laser Engineering, Volume. 50, Issue 3, 20200209(2021)

Effect of surface roughness on THz reflection measurement

Xiuwei Yang1...2,3, Dehai Zhang1, Zhongjun Xiao3, Xiangdong Li3 and Lin Zhang3 |Show fewer author(s)
Author Affiliations
  • 1Key Laboratory of Microwave Remote Sensing, National Space Science Center, Chinese Academy of Sciences, Beijing 100190, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
  • 3Institute of Automation, Qilu University of Technology(Shandong Academy of Sciences), Key Laboratory of UWB & THz of Shandong Academy of Sciences, Jinan 250013, China
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    Figures & Tables(6)
    Schematic diagram of terahertz wave propagation process
    Glucose tablets of different roughness
    Schematic diagram of the reflection mode measurement method. Where, A1, A2 and A3 stands for the focusing lens, BS stands for beam splitter, M1, M2, M3, M4, M5 and M6 stands for the plane mirror, PM1, PM2, PM3 and PM4 stands for the off-axis parabolic mirror, GaAs stands for the gallium arsenide photoconductive antenna, WP stands for the Wollaston prism, Lock stands for Lock-in amplifier
    Reflection spectrum of terahertz waves incident vertically on the surface of smooth, 60 and 360 mesh sandpaper-pressed samples
    Reconstruction of a smooth-surface spectrum from a rough-surface of 60
    Reconstruction of a smooth-surface spectrum from a rough-surface of 360
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    Xiuwei Yang, Dehai Zhang, Zhongjun Xiao, Xiangdong Li, Lin Zhang. Effect of surface roughness on THz reflection measurement[J]. Infrared and Laser Engineering, 2021, 50(3): 20200209

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    Paper Information

    Category: Photoelectric measurement

    Received: Dec. 6, 2020

    Accepted: --

    Published Online: Jul. 15, 2021

    The Author Email:

    DOI:10.3788/IRLA20200209

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