Infrared and Laser Engineering, Volume. 50, Issue 3, 20200209(2021)
Effect of surface roughness on THz reflection measurement
Fig. 3. Schematic diagram of the reflection mode measurement method. Where, A1, A2 and A3 stands for the focusing lens, BS stands for beam splitter, M1, M2, M3, M4, M5 and M6 stands for the plane mirror, PM1, PM2, PM3 and PM4 stands for the off-axis parabolic mirror, GaAs stands for the gallium arsenide photoconductive antenna, WP stands for the Wollaston prism, Lock stands for Lock-in amplifier
Fig. 4. Reflection spectrum of terahertz waves incident vertically on the surface of smooth, 60 and 360 mesh sandpaper-pressed samples
Fig. 5. Reconstruction of a smooth-surface spectrum from a rough-surface of 60
Fig. 6. Reconstruction of a smooth-surface spectrum from a rough-surface of 360
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Xiuwei Yang, Dehai Zhang, Zhongjun Xiao, Xiangdong Li, Lin Zhang. Effect of surface roughness on THz reflection measurement[J]. Infrared and Laser Engineering, 2021, 50(3): 20200209
Category: Photoelectric measurement
Received: Dec. 6, 2020
Accepted: --
Published Online: Jul. 15, 2021
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