Reflection Properties of Guided Wave in Fiber Taper Used for Scanning Near-Field Optical Microscopy

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Acta Optica Sinica, Volume. 19, Issue 6, 826(1999)

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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References(3)

[1] [1] Bezig E, Grubb S G, Chichester R J et al.. Fiber laser probe for near-field scanning optical microscopy. Appl. Phys. Lett., 1993, 63(26):3550～3552

[2] [2] Zhang Guoping, Ming Hai, Chen Xiaogang et al.. Experimental researches on active fiber probe for scanning near-field optical microscopy. Chinese J. Lasers, 1997, B6(6):513～517

[4] [4] Roderick W C, Love J D. Back-reflexion from fused biconic couplers. J. Lightwave Tech., 1995, 13(11):2282～2289

CLP Journals

[1] Yang Yongbin, Xu Wendong. Theoretical Analysis of Fabricating Near-field Optical Probe by Chemical Etching Method Combining Static Etching and Dynamic Etching[J]. Acta Optica Sinica, 2008, 28(s2): 367

[2] Chang'an Li, Lina Xu, Ning Gu. Electroless silver plating for metallization of near-field optical fiber probes[J]. Chinese Optics Letters, 2007, 5(10): 594

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Reflection Properties of Guided Wave in Fiber Taper Used for Scanning Near-Field Optical Microscopy[J]. Acta Optica Sinica, 1999, 19(6): 826

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Paper Information

Category: Optical Devices

Received: Sep. 30, 1997

Accepted: --

Published Online: Aug. 9, 2006

The Author Email:

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology