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Electro-Optic Technology Application, Volume. 24, Issue 5, 70(2009)

Emulating Analysis of Calculating Methodology for Scanning Period of Infrared Imaging Instrument

WANG Shou-hui1, WANG Dong1, WEI Lan-lan1, and ZHANG Shi-yong2
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  • 2[in Chinese]
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    WANG Shou-hui, WANG Dong, WEI Lan-lan, ZHANG Shi-yong. Emulating Analysis of Calculating Methodology for Scanning Period of Infrared Imaging Instrument[J]. Electro-Optic Technology Application, 2009, 24(5): 70

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    Received: Aug. 31, 2009

    Accepted: --

    Published Online: Dec. 30, 2009

    The Author Email:

    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology