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Semiconductor Optoelectronics, Volume. 44, Issue 4, 596(2023)

A New Method for Measuring The Minority Carrier Lifetime of MWIR HgCdTe Materials by Transient Photoresponse Method

HUANG Hong1...2, SANG Maosheng2, WANG Nili2, XU Guoqing2 and XU Jintong2,* |Show fewer author(s)
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    HUANG Hong, SANG Maosheng, WANG Nili, XU Guoqing, XU Jintong. A New Method for Measuring The Minority Carrier Lifetime of MWIR HgCdTe Materials by Transient Photoresponse Method[J]. Semiconductor Optoelectronics, 2023, 44(4): 596

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    Received: Apr. 23, 2023

    Accepted: --

    Published Online: Nov. 26, 2023

    The Author Email: Jintong XU (xujintong@mail.sitp.ac.cn)

    DOI:10.16818/j.issn1001-5868.2023042302

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology