Laser & Optoelectronics Progress, Volume. 55, Issue 11, 111201(2018)

Three-Degree-of-Freedom Measurement Method Based on Plane Normal Vector

Guoming Fang1,2,3、**, Qi Peng1,2、*, Haotong Ma1,2, Shan Qiao1,2,3, Jiang Bian2, Feng Chen1,2,3, Xincheng Liu1,2,3, Yufeng Tan1,2,3, Bi He1,2,3, and Li Dong1,2,3
Author Affiliations
  • 1 Key Laboratory of Optical Engineering, Chinese Academy of Sciences, Chengdu, Sichuan 610209, China
  • 2 Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, Sichuan 610209, China
  • 3 University of Chinese Academy of Sciences, Beijing 100049, China
  • show less
    References(16)

    [7] Garcia A M, Cordero R, Rayas J A. Two-wavelength electronic speckle-pattern interferometry for simultaneous measurement of two in-plane displacement fields[C]. Latin America Optics and Photonics Conference, LM1A, 3(2014).

    [16] Butler S C, Ricci M A, Wang C et al. Homodyne displacement measuring interferometer probe for optical coordinate measuring machine with tip and tilt sensitivity[C]. Proceedings of SPIE, 9633, 96332E(2015).

    Tools

    Get Citation

    Copy Citation Text

    Guoming Fang, Qi Peng, Haotong Ma, Shan Qiao, Jiang Bian, Feng Chen, Xincheng Liu, Yufeng Tan, Bi He, Li Dong. Three-Degree-of-Freedom Measurement Method Based on Plane Normal Vector[J]. Laser & Optoelectronics Progress, 2018, 55(11): 111201

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: --

    Accepted: --

    Published Online: Aug. 14, 2019

    The Author Email: Fang Guoming (fangguoming15@mails.ucas.ac.cn), Peng Qi (phiqi@163.com)

    DOI:10.3788/LOP55.111201

    Topics