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Opto-Electronic Science, Volume. 1, Issue 3, 210014-1(2022)

Terahertz metasurface zone plates with arbitrary polarizations to a fixed polarization conversion

Zhen Yue1,†... Jitao Li1,†, Jie Li1,†, Chenglong Zheng1,†, Jingyu Liu2, Guocui Wang2,3, Hang Xu1, Mingyang Chen4, Yating Zhang1,*, Yan Zhang2,* and Jianquan Yao1,* |Show fewer author(s)
Author Affiliations
  • 1Key Laboratory of Opto-Electronics Information Technology (Tianjin University), Ministry of Education, School of Precision Instruments and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China
  • 2Beijing Key Laboratory for Metamaterials and Devices, Department of Physics, Capital Normal University, Beijing 100048, China
  • 3Beijing Engineering Research Center for Mixed Reality and Advanced Display, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China
  • 4Department of Optoelectronic Information Science and Engineering, Jiangsu University, Zhenjiang 212013, China
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    (a) Performing diagram of x-LP beam generator. (b) Schematic diagram of RCP beam generation under non-polarized incidence.

    Fig. 1. (a) Performing diagram of x-LP beam generator. (b) Schematic diagram of RCP beam generation under non-polarized incidence.

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    (a) Schematic diagram of the linear polarizer. (b) Simulated results on the xz plane under x-LP incidence. (c) The intensity distributions of the transmitted x-LP and y-LP components on the xz plane under y-LP illumination. (d) The intensity profiles of the orthogonal LP components of the outgoing wave at the focal plane, under different polarized incidences.

    Fig. 2. (a) Schematic diagram of the linear polarizer. (b) Simulated results on the xz plane under x-LP incidence. (c) The intensity distributions of the transmitted x-LP and y-LP components on the xz plane under y-LP illumination. (d) The intensity profiles of the orthogonal LP components of the outgoing wave at the focal plane, under different polarized incidences.

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    (a) SEM image of the sample. (b) The measured intensity profiles of x-LP and y-LP components on the focal plane, under the incidences of four polarized waves.

    Fig. 3. (a) SEM image of the sample. (b) The measured intensity profiles of x-LP and y-LP components on the focal plane, under the incidences of four polarized waves.

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    (a) Schematic of the Meta-atom 1. (b) Top view of the Meta-atom 2. (c) Transmission amplitudes of cross- and co-polarized components at different frequencies, under LCP incidence. (d) Simulated results of phase shifts under LCP incidence. (e) The relationship between the transmission amplitudes of the orthogonal CP components and the incident frequency, when the RCP wave is incident. (f) The phase shift of the transmitted LCP wave at different incident frequencies under RCP incidence.

    Fig. 4. (a) Schematic of the Meta-atom 1. (b) Top view of the Meta-atom 2. (c) Transmission amplitudes of cross- and co-polarized components at different frequencies, under LCP incidence. (d) Simulated results of phase shifts under LCP incidence. (e) The relationship between the transmission amplitudes of the orthogonal CP components and the incident frequency, when the RCP wave is incident. (f) The phase shift of the transmitted LCP wave at different incident frequencies under RCP incidence.

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    (a) Schematic diagram of the structure of the metasurface zone plate. (b, c) The intensity distributions of the cross- and co-polarized components at the focal plane under CP incidences. (d) The simulated intensity distribution of the focal plane under LP and EP incidences.

    Fig. 5. (a) Schematic diagram of the structure of the metasurface zone plate. (b, c) The intensity distributions of the cross- and co-polarized components at the focal plane under CP incidences. (d) The simulated intensity distribution of the focal plane under LP and EP incidences.

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    (a) SEM image of the fabricated metasurface zone plate. (b) The measured intensity profiles of the focal plane under CP and LP incidences. The inset is the intensity distribution across the focus along the x-axis.

    Fig. 6. (a) SEM image of the fabricated metasurface zone plate. (b) The measured intensity profiles of the focal plane under CP and LP incidences. The inset is the intensity distribution across the focus along the x-axis.

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    Zhen Yue, Jitao Li, Jie Li, Chenglong Zheng, Jingyu Liu, Guocui Wang, Hang Xu, Mingyang Chen, Yating Zhang, Yan Zhang, Jianquan Yao. Terahertz metasurface zone plates with arbitrary polarizations to a fixed polarization conversion[J]. Opto-Electronic Science, 2022, 1(3): 210014-1

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    Paper Information

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    Received: Dec. 19, 2021

    Accepted: Feb. 16, 2022

    Published Online: May. 5, 2022

    The Author Email: Zhang Yating (;;;;;;;;;;;;;;;;;;;;;;;;;;), Zhang Yan (;;;;;;;;;;;;;;;;;;;;;;;;;;), Yao Jianquan (;;;;;;;;;;;;;;;;;;;;;;;;;;)

    DOI:10.29026/oes.2022.210014

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology