Infrared Technology, Volume. 45, Issue 5, 553(2023)

Calculation of Parameters for Long Wave Infrared FPA Detectors Applied in Low-temperature Background

Jingxiang MAO1... Jianhua GUO1, Lihua LI1, Linglei KONG2 and Zhengkai WANG3 |Show fewer author(s)
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    References(6)

    [2] [2] Campos T. Test Bench for Infrared Detectors[C]//Proc. of SPIE, 2005, 5640: 183-192.

    [8] [8] Willardson R K, Albert C Beer. Semiconductors and Semimetals, V18 Mercury Cadmium Telluride[M]. New York: ACADEMIC PRESS, A Subsidiary of Harcourt Brace Jovanovich, Publishers, 1981.

    [9] [9] Vincent J D. Fundamentals of Infrared Detector Operation and Testing[M]. New York: A Wiley-Interscience Publication, John Wiley & Sons, 1990.

    [14] [14] Antoni Rogalski. Infrared Detectors[M]. Second Edition, Boca Raton: CRC Press, 2011.

    [15] [15] Shkedy L, Armon E, Avnon E, et al. Hot MWIR detector with 5.m pitch[C]//Proc. of SPIE, 2021, 11741: 117410W1-11.

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    MAO Jingxiang, GUO Jianhua, LI Lihua, KONG Linglei, WANG Zhengkai. Calculation of Parameters for Long Wave Infrared FPA Detectors Applied in Low-temperature Background[J]. Infrared Technology, 2023, 45(5): 553

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    Paper Information

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    Received: Mar. 1, 2022

    Accepted: --

    Published Online: Jan. 15, 2024

    The Author Email:

    DOI:

    CSTR:32186.14.

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