Laser & Optoelectronics Progress, Volume. 60, Issue 9, 0912002(2023)

Refraction Error Compensation of Transparent Layer in Single-Screen Phase Measuring Deflection

Linfeng Li1,2, Qitai Huang1,2、*, Jianfeng Ren1,2, and Mingyang Hou3
Author Affiliations
  • 1School of Optoelectronic Science and Engineering & Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University, Suzhou 215006, Jiangsu, China
  • 2Key Lab of Advanced Optical Manufacturing Technologies of Jiangsu Province & Key Lab of Modern Optical Technologies of Education Ministry of China, Soochow University, Suzhou 215006, Jiangsu, China
  • 3Beijing Institute of Space Mechanics & Electricity, Beijing 100094, China
  • show less
    Figures & Tables(8)
    Schematic diagram of phase measuring deflection (PMD) structure
    LCD structure diagram
    Phase gradient mapping of refraction effect of transparent layer of display screen
    Measurement flow chart
    PMD system
    Plane flat crystal surface residuals before and after compensation. (a) PV is 0.83 µm and RMS is 0.15 µm before compensation; (b) PV is 0.59 µm and RMS is 0.12 µm after compensation
    Spherical mirror surface residuals before and after compensation. (a) PV is 1.14 µm and RMS is 0.22 µm before compensation; (b) PV is 0.71 µm and RMS is 0.14 µm after compensation
    • Table 1. Experimental instrument parameters

      View table

      Table 1. Experimental instrument parameters

      ModelResolutionPixel size
      CCD

      HIKVISION

      MV-CE123-10UM

      4000 pixel×3036 pixel1.8 µm
      LCD

      SAMSUNG

      U28R550UQC

      3840 pixel×2160 pixel0.16 mm
    Tools

    Get Citation

    Copy Citation Text

    Linfeng Li, Qitai Huang, Jianfeng Ren, Mingyang Hou. Refraction Error Compensation of Transparent Layer in Single-Screen Phase Measuring Deflection[J]. Laser & Optoelectronics Progress, 2023, 60(9): 0912002

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Mar. 11, 2022

    Accepted: May. 23, 2022

    Published Online: May. 9, 2023

    The Author Email: Huang Qitai (huangqitai@126.com)

    DOI:10.3788/LOP220962

    Topics