Infrared and Laser Engineering, Volume. 53, Issue 5, 20240059(2024)
Automated interferometry test of high-cleanliness ultra-smooth aspherical surfaces
Fig. 5. Stewart stage with backplane. (a) Integrated backplane mounted on the Stewart stage; (b) Aspheric surface mounted on the backplane via a snap-in connector; (c) Aspheric surface, backplane and Stewart stage after installation
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Ling Li, Jiafu Zhang, Xin Tao, Zongwei Yu, Mengxu Li, Renyuan Wang, Xi Chen, Chengguang Cui, Xiangdong Wang. Automated interferometry test of high-cleanliness ultra-smooth aspherical surfaces[J]. Infrared and Laser Engineering, 2024, 53(5): 20240059
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Received: Feb. 1, 2024
Accepted: --
Published Online: Jun. 21, 2024
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