Elliptically-bent crystal spectrograph for X-ray diagnosis of laser-produced plasmas

Xiancai Xiong; Xianxin Zhong; Shali Xiao; Guohong Yang; Jie Gao

Chinese Optics Letters, Volume. 2, Issue 1, 0127(2004)

Xiancai Xiong^1、*, Xianxin Zhong¹, Shali Xiao¹, Guohong Yang², and Jie Gao¹

Author Affiliations

¹Key Laboratory of Optoelectronic Technology and System, Chongqing University, Chongqing 400044

²Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900

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References(8)

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CLP Journals

[1] Wu Tao, Wang Xinbing, Tang Jian, Wang Shaoyi, Rao Zhiming, Yang Chenguang, Lu Hong. Extreme Ultraviolet and Visible Emission Spectroscopic Characterization of CO₂ Laser Produced Tin Plasma for Lithography[J]. Acta Optica Sinica, 2012, 32(4): 430002

[2] Jun Shi, Shali Xiao, Hongjian Wang, Xianbin Huang, Libing Yang, Shenye Liu. Detection of the X-ray spectra of imploding neon Z-pinch with elliptically bent mica crystal spectrometer[J]. Chinese Optics Letters, 2008, 6(8): 622

[3] Shali Xiao, Yingjun Pan, Xianxin Zhong, Xiancai Xiong, Guohong Yang, Zongli Liu, Yongkun Ding. High-resolution X-ray focusing concave (elliptical) curved crystal spectrograph for laser-produced plasma[J]. Chinese Optics Letters, 2004, 2(8): 08495

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Xiancai Xiong, Xianxin Zhong, Shali Xiao, Guohong Yang, Jie Gao. Elliptically-bent crystal spectrograph for X-ray diagnosis of laser-produced plasmas[J]. Chinese Optics Letters, 2004, 2(1): 0127

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Paper Information

Category: Instrumentation, measurement, and metrology

Received: Jul. 4, 2003

Accepted: --

Published Online: Jun. 6, 2006

The Author Email: Xiancai Xiong (xiongxc@cqu.edu.cn)

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology