Researching | Measurement of Quantum Yield and Image of Microchannel Plate in Near Ultraviolet Band

Acta Photonica Sinica, Volume. 49, Issue 3, 0325001(2020)

Measurement of Quantum Yield and Image of Microchannel Plate in Near Ultraviolet Band

Xiao-feng LI... Le CHANG, Yong-sheng QIU, Yong-xiang WU and Yong-chun LI |Show fewer author(s)

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North night vision technology Co., Ltd, Kunming 650217, China

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Fig. 1. Photoelectron generated in the channel of MCP

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Fig. 2. Diagram of structure of testing sample

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Fig. 3. Schematic diagram of testing device

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Fig. 4. Quantum yield in different voltage of MCP

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Fig. 5. Image flame of alcohol lighter

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Fig. 6. Image of character illuminated by the mercury lamp

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Fig. 7. The image of resolution target

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Table 1. Quantum yield of MCP in different operating voltages

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Table 1. Quantum yield of MCP in different operating voltages

λ/nm	200	220	240	260	280	300	320	340
Y_1500V	1.1×10^－4	4.6×10^－5	2.0×10^－5	8.1×10^－5	1.9×10^－6	3.4×10^－7	2.4×10^－8	1.0×10^－8
Y_1600V	1.1×10^－4	4.2×10^－5	1.9×10^－5	8.1×10^－5	2.3×10^－6	5.2×10^－7	4.0×10^－8	1.9×10^－8
Y_1700V	1.1×10^－4	4.3×10^－5	1.9×10^－5	8.4×10^－5	2.5×10^－6	6.5×10^－7	5.7×10^－8	2.7×10^－8

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Xiao-feng LI, Le CHANG, Yong-sheng QIU, Yong-xiang WU, Yong-chun LI. Measurement of Quantum Yield and Image of Microchannel Plate in Near Ultraviolet Band[J]. Acta Photonica Sinica, 2020, 49(3): 0325001

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Paper Information

Category: Optoelectronics

Received: Nov. 8, 2019

Accepted: Nov. 28, 2019

Published Online: Apr. 24, 2020

The Author Email:

DOI:10.3788/gzxb20204903.0325001

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology