Infrared and Laser Engineering, Volume. 35, Issue 3, 294(2006)
Growth and defects characterization of HgCdTe film grown by LPE method
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[in Chinese], [in Chinese], [in Chinese]. Growth and defects characterization of HgCdTe film grown by LPE method[J]. Infrared and Laser Engineering, 2006, 35(3): 294