[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Opto-Electronic Engineering, Volume. 32, Issue 5, 55(2005)

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[in Chinese]... [in Chinese], [in Chinese], [in Chinese] and [in Chinese] |Show fewer author(s)

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References(1)

[5] [5] Edward P LYVERS, Owen Robert MITCHELL, Mark L AKEY, et al. Subpixel measurements using a moment-based edge operator[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 1989, 11 (12): 1293-1307.

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Paper Information

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Received: Nov. 8, 2004

Accepted: --

Published Online: Nov. 14, 2007

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Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology

CLP Journals

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