Electronics Optics & Control, Volume. 27, Issue 10, 105(2020)

Design and Simulation of Anti-Single-Event-Upset in AFDX Switch Based on FPGA

XIE Wenguang1...2, WANG Kenian1,2, ZHANG Xiaochen2 and WU Kang2 |Show fewer author(s)
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    References(6)

    [2] [2] CESCHIA M. VIOLANTE M. REORDA M S. et al.Identification and classification of single-event upsets in the configuration memory of SRAM-based FPGAs[J].IEEE Transactions on Nuclear Science. 2003. 50(6):2088-2094.

    [4] [4] STERPONE L. VIOLANTE M.A new analytical approach to estimate the effects of SEUs in TMR architectures implemented through SRAM-based FPGAs[J].IEEE Tran-sactions on Nuclear Science. 2005. 52(6):2217-2223.

    [5] [5] BARAZA J C. GRACIA J. BLANC S. et al.Enhancement of fault injection techniques based on the modification of VHDL code[J].IEEE Transactions on Very Large Scale Integration Systems. 2008. 16(6):693-706.

    [6] [6] ALDERIGHI M. D'ANGELO S. MANCINI M. et al.A fault injection tool for SRAM-based FPGAs[C]//The 9th International On-Line Testing Symposium. IEEE. 2003:129-133.

    [7] [7] ZHANG R S. XIAO L Y. LI J.A fast and accurate fault injection platform for SRAM-based FPGAs[C]//The 12th International Conference on ASIC. IEEE. 2017:435-438.

    [9] [9] Aeronautical Radio Inc.Aircraft data network-Part 7:Avionics full-duplex switched Ethernet network[S].[S.l.]ARINC. 2005.

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    XIE Wenguang, WANG Kenian, ZHANG Xiaochen, WU Kang. Design and Simulation of Anti-Single-Event-Upset in AFDX Switch Based on FPGA[J]. Electronics Optics & Control, 2020, 27(10): 105

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    Paper Information

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    Received: Dec. 19, 2019

    Accepted: --

    Published Online: Dec. 25, 2020

    The Author Email:

    DOI:10.3969/j.issn.1671-637x.2020.10.021

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