Electronics Optics & Control, Volume. 27, Issue 10, 105(2020)

Design and Simulation of Anti-Single-Event-Upset in AFDX Switch Based on FPGA

XIE Wenguang1...2, WANG Kenian1,2, ZHANG Xiaochen2 and WU Kang2 |Show fewer author(s)
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  • 1[in Chinese]
  • 2[in Chinese]
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    In the flight environment of civil aviation. there are various high-energy particles. which may result in the effect of Single Event Upset (SEU) when acting on avionic equipment's SRAM-based FPGA. and cause device logic fault and system breakdown.Hence. the corresponding design of anti-single-event-upset must be taken into consideration for the SRAM-based FPGA in airborne equipment.According to the basic structure of AFDX switch. the concrete design measures are given for anti-single-event-upset of the FPGA based AFDX switch. and simulation-based verification is conducted by using the method of fault injection.It is shown that the method can effectively enhance the performance of resisting single event upset in FPGA based AFDX switch. thus can improve the reliability and stability of system in the application of aviation flight.

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    XIE Wenguang, WANG Kenian, ZHANG Xiaochen, WU Kang. Design and Simulation of Anti-Single-Event-Upset in AFDX Switch Based on FPGA[J]. Electronics Optics & Control, 2020, 27(10): 105

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    Paper Information

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    Received: Dec. 19, 2019

    Accepted: --

    Published Online: Dec. 25, 2020

    The Author Email:

    DOI:10.3969/j.issn.1671-637x.2020.10.021

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