Electronics Optics & Control, Volume. 25, Issue 11, 106(2018)

Optimization Design of Step-up Stress Accelerated Degradation Test for a Photoelectric Coupler with Lognormal Distributed Life

ZHANG Xuan-gong1... MU Xi-hui1 and FENG jing2 |Show fewer author(s)
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    References(6)

    [1] [1] MILLER R, NELSON W B.Optimum simple step-stress accelerated life testing[J].IEEE Transactions on Reliability, 1983, 32(1):59-65.

    [2] [2] NELSON W.Accelerated testing:statistical methods, test plans, and data analysis[M].New York:John Wiley Press, 1990.

    [4] [4] TSENG S T, YU H F.A termination rule for degradation experiments [J].IEEE Transactions on Reliability, 1997, 46(1):130-133.

    [5] [5] WU S J, CHANG C T.Optimal design of degradation tests in presence of cost constraint[J].Reliability Engineering & System Safety, 2002, 76(2):109-115.

    [6] [6] YU H F, TSENG S T.Designing a degradation experiment[J].Naval Research Logistics, 1999, 46(6):689-706.

    [7] [7] YU H F, TSENG S T.Designing a degradation experiment with a reciprocal Weibull degradation rate[J].Quality Technology & Quantitative Management, 2004, 1(1):47-63.

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    ZHANG Xuan-gong, MU Xi-hui, FENG jing. Optimization Design of Step-up Stress Accelerated Degradation Test for a Photoelectric Coupler with Lognormal Distributed Life[J]. Electronics Optics & Control, 2018, 25(11): 106

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    Paper Information

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    Received: Jun. 14, 2018

    Accepted: --

    Published Online: Nov. 25, 2018

    The Author Email:

    DOI:10.3969/j.issn.1671-637x.2018.11.021

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