Acta Optica Sinica, Volume. 21, Issue 6, 734(2001)
Analysis of Measuring Condition for Principle Angle in Spectroscopic Ellipsometry
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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Analysis of Measuring Condition for Principle Angle in Spectroscopic Ellipsometry[J]. Acta Optica Sinica, 2001, 21(6): 734