Acta Photonica Sinica, Volume. 31, Issue 4, 454(2002)
X-RAY DIFFRACTION ANALYSIS ON THE Al CONTENT OF THE AlGaAs BUFFER LAYER IN THE TRANSPARENT GaAs PHOTOCATHODE
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[3] [3] Fewster P F.X-ray diffraction from low dimensional structures.Semicond Sci Technol,1993,8(10):1915～1934
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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. X-RAY DIFFRACTION ANALYSIS ON THE Al CONTENT OF THE AlGaAs BUFFER LAYER IN THE TRANSPARENT GaAs PHOTOCATHODE[J]. Acta Photonica Sinica, 2002, 31(4): 454
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