Infrared and Laser Engineering, Volume. 50, Issue 11, 20210009(2021)

Pixel-level high resolution and low error rate time-to-digital converter circuit of single photon detection InGaAs avalanche focal plane array

Xu Liu1...2,3, Yunduo Li1,2,3, Lianhua Ye1,2,3, Zhangcheng Huang1,2, Songlei Huang1,2, and Jiaxiong Fang12 |Show fewer author(s)
Author Affiliations
  • 1State Key Laboratories of Transducer Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
  • 2Key Laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
  • 3University of Chinese Academy of Sciences, Beijing 100049, China
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    Figures & Tables(23)
    Working principle of time-to-digital converter circuit
    Structure of three-stage time-to-digital converter circuit
    Working sequence of three-stage time-to-digital converter circuit
    Three-stage time-to-digital converter circuit
    Structure of delay-locked loop circuit
    Voltage-controlled delay chain and delay unit
    Voltage-controlled delay chain - Multi-stage split-phase clock
    Global clock network layout
    Low segment data latch circuit. (a) Data latch circuit before optimization; (b) Data latch circuit after optimization
    Schematic diagram of inter-segment errors
    Delay error of asynchronous counter
    Delayed sampling of M_TDC signal
    High segment - linear feedback shift register
    Microscope photo of array type TDC
    Block diagram of TDC test system
    Time-to-digital conversion curve. (a) Full-scale conversion curve; (b) 1112 ns partial amplification conversion curve
    Statistical distribution of TDC conversion steps
    Differential non-linearity test results
    Integral non-linearity test result
    Non-ideal duty cycle split-phase clock
    • Table 1. Count value of time-to-digital converter circuit

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      Table 1. Count value of time-to-digital converter circuit

      STOP signal effective areaABCDE
      Middle and high TDC count valuenn+1 n+1 n+1 n+1
      D1_CLK latch level00110
      Latched correctly ?NoYesNoYesNo
    • Table 2. Conversion step size statistics of time-to-digital converter circuit

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      Table 2. Conversion step size statistics of time-to-digital converter circuit

      Ideal conversion stepActual conversion step
      0-0.5T0.7T
      0.5-1.0T0.4T
      1.0-1.5T0.5T
      1.5-2.0T0.5T
      2.0-2.5T0.4T/0.3T
      2.5-3.0T0.5T
      3.0-3.5T0.5T
      3.5-4.0T0.5T/0.6T
    • Table 3. Summary of time-to-digital circuit index

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      Table 3. Summary of time-to-digital circuit index

      ParameterRef. [2] Ref. [12] Ref. [13] This work
      CMOS technology/nm350130350180
      Supply voltage/V3.31.23.31.8
      Pixel pitch/μm15050100100
      Pixel array32×3232×3216×1664×64
      TDC frame rate/kHz1005002020
      TDC resolution/ns0.3120.1190.5750.5
      DNL/LSB0.060.4−0.57–0.58−0.4–0.4
      INL/LSB0.221.2−0.9–0.57−0.4–0.6
      TDC range/μs0.320.124.08
      Power consumption/mW31590/Core only151.8380.5
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    Xu Liu, Yunduo Li, Lianhua Ye, Zhangcheng Huang, Songlei Huang, Jiaxiong Fang. Pixel-level high resolution and low error rate time-to-digital converter circuit of single photon detection InGaAs avalanche focal plane array[J]. Infrared and Laser Engineering, 2021, 50(11): 20210009

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    Paper Information

    Category: Infrared technology and application

    Received: Dec. 28, 2020

    Accepted: --

    Published Online: Dec. 7, 2021

    The Author Email:

    DOI:10.3788/IRLA20210009

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