Infrared and Laser Engineering, Volume. 50, Issue 11, 20210371(2021)

Inverting optical constants of YbF3 and YF3 thin films in the ultra-wide spectrum from 0.4 to 14 μm

Zhiqi Zheng... Yongqiang Pan, Huan Liu, Weirong Yang, Ziyang He, Dong Li and Zelin Zhou |Show fewer author(s)
Author Affiliations
  • School of Optoelectronic Engineering, Xi’an Technological University, Xi’an 710021, China
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    References(14)

    [1] Huasong Liu, Xuan Fu, Lishuan Wang, et al. Characterization of optical properties of weak absorption thin film. Infrared and Laser Engineering, 42, 2108-2114(2013).

    [2] Yidong Feng, Tianyan Yu, Dingquan Liu. Influence of deposition process on reliability of YbF3 thin films. Acta Optica Sinica, 38, 0731002(2018).

    [3] Lingmao Xu, Yanchun He, Jun Zheng, et al. Infrared optical properties of yttrium fluoride thin films at low temperature. China Surface Engineering, 32, 151-155(2019).

    [4] Yaoping Zhang, Yundong Zhang, Ning Ling, et al. Effect of substrate temperature on defects and optical properties of YbF3 thin films. Optical Instruments, 93-96(2006).

    [5] Xiulan Ling, Wei Huang. Effects of process parameters and deposition methods on defects of ZnS/YbF3 thin films. Optical Instruments, 28, 71-74(2006).

    [6] Duoshu Wang, Youlu Li, Kaipeng Li, et al. Research method of the temperature characteristic of infrared thin-films. Infrared and Laser Engineering, 47, 0404006(2018).

    [7] Wei Li, Chengyu Jin. Elliptic polarization data analysis method for thin film materials. Chinese Journal of Spectroscopy Laboratory, 27, 66-76(2010).

    [8] T Amotchkina, M Trubetskov, D Hahner, et al. Characterization of e-beam evaporated Ge, YbF3, ZnS, and LaF3 thin films for laser-oriented coatings. Applied Optics, 59, A40(2020).

    [9] H Liu, S Li, D Chen, et al. Study on broadband optical constants of yttrium fluoride thin films deposited by electron beam evaporation. Optik - International Journal for Light and Electron Optics, 205, 163548(2019).

    [10] Yiqin Ji, Huasong Liu, Yanmin Zhang. Measurement and analysis of optical film constants. Infrared and Laser Engineering, 35, 513-518(2006).

    [11] Kaipeng Li, Duoshu Wang, Chen Li, et al. Study on optical thin film parameters measurement method. Infrared and Laser Engineering, 44, 1048-1052(2015).

    [12] Disheng Zhong, Luqhuan Wang, Yingzhi Yu. Measurement of optical constants of thin films by spectrophotometry. Journal of Liaoning University (Natural Science Edition), 1-13(1996).

    [13] Weidong Shen, Xu Liu, Yong Zhu, et al. Determination of optical constants and thickness of semiconductor thin films using transmittance test curve. Acta Semiconductors, 335-340(2005).

    [14] Yang Qin, Rongfu Zhang. Preparation of ytterbium fluoride films at different temperatures. Optical Instruments, 40-94(2018).

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    Zhiqi Zheng, Yongqiang Pan, Huan Liu, Weirong Yang, Ziyang He, Dong Li, Zelin Zhou. Inverting optical constants of YbF3 and YF3 thin films in the ultra-wide spectrum from 0.4 to 14 μm[J]. Infrared and Laser Engineering, 2021, 50(11): 20210371

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    Paper Information

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    Received: Jun. 3, 2021

    Accepted: --

    Published Online: Dec. 7, 2021

    The Author Email:

    DOI:10.3788/IRLA20210371

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