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Journal of Advanced Dielectrics, Volume. 14, Issue 6, 2450004(2024)

Atomic resolution microstructure study of Bi-doped SrTiO3

Chao Li1,*... Yijun Zhang2, Guohua Dong2, Guangliang Hu2, Guang Yang2, Chaoqiang Liu3, Houwen Chen3 and Xiaoyong Wei2 |Show fewer author(s)
Author Affiliations
  • 1Instrumental Analysis Center,Xi’an Jiaotong University,Xi’an 710049,P. R. China
  • 2Electronic Materials Research Laboratory,Key Laboratory of The Ministry of Education & International,Center for Dielectric Research,Xi’an Jiaotong University,Xi’an 710049,P. R. China
  • 3College of Materials Science and Engineering & Electron Microscopy Center of Chongqing University,Chongqing 400044,P. R. China
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    Chao Li, Yijun Zhang, Guohua Dong, Guangliang Hu, Guang Yang, Chaoqiang Liu, Houwen Chen, Xiaoyong Wei. Atomic resolution microstructure study of Bi-doped SrTiO3[J]. Journal of Advanced Dielectrics, 2024, 14(6): 2450004

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    Paper Information

    Category: Research Articles

    Received: Dec. 31, 2023

    Accepted: Feb. 28, 2024

    Published Online: Jan. 14, 2025

    The Author Email: Li Chao (chaolixjtu@xjtu.edu.cn)

    DOI:10.1142/S2010135X24500048

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology