Chinese Journal of Quantum Electronics, Volume. 22, Issue 3, 468(2005)

Applied study of scanning and imaging system based on equal angle sampling and equal time sampling controlled technology

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Applied study of scanning and imaging system based on equal angle sampling and equal time sampling controlled technology[J]. Chinese Journal of Quantum Electronics, 2005, 22(3): 468

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    Received: Mar. 8, 2004

    Accepted: --

    Published Online: May. 15, 2006

    The Author Email: (jianxz@yahoo.com.cn)

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