Optics and Precision Engineering, Volume. 32, Issue 2, 137(2024)

Study of a consistent assembly system for AFM probes based on beam deflection method

Baoliang ZHANG1,2, Wenfeng LIANG1, Tie YANG2,3, and Peng YU2,3、*
Author Affiliations
  • 1School of Mechanical Engineering, Shenyang Jianzhu University, Shenyang068 , China
  • 2State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang110016, China
  • 3Institutes for Robotics and Intelligent Manufacturing, Chinese Academy of Sciences, Shenyang110169, China
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    Figures & Tables(14)
    Working principle of AFM system
    Schematic diagram of beam deflection in AFM system
    Schematic diagram of beam deflection in probe consistency system
    Optical path consistency adjustment design schematic
    Mechanical structure design drawing of probe consistent assembly system
    Consistency probe transfer and replacement flowchart
    Probe consistency assembly system physical
    Probe assembly physical drawing
    System light lever amplification ratio measurement chart
    Probe position offset during UV curing
    Probe position offset after compensating for UV adhesive curing deformation
    Consistency probe assembly position data
    Noise variation at different distances of laser spot from PSD center
    AFM scan image at different distances from the center of the PSD
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    Baoliang ZHANG, Wenfeng LIANG, Tie YANG, Peng YU. Study of a consistent assembly system for AFM probes based on beam deflection method[J]. Optics and Precision Engineering, 2024, 32(2): 137

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    Paper Information

    Category:

    Received: May. 10, 2023

    Accepted: --

    Published Online: Apr. 2, 2024

    The Author Email: YU Peng (yupeng@sia.cn)

    DOI:10.37188/OPE.20243202.0137

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