Optics and Precision Engineering, Volume. 32, Issue 2, 137(2024)
Study of a consistent assembly system for AFM probes based on beam deflection method
Fig. 3. Schematic diagram of beam deflection in probe consistency system
Fig. 5. Mechanical structure design drawing of probe consistent assembly system
Fig. 11. Probe position offset after compensating for UV adhesive curing deformation
Fig. 13. Noise variation at different distances of laser spot from PSD center
Fig. 14. AFM scan image at different distances from the center of the PSD
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Baoliang ZHANG, Wenfeng LIANG, Tie YANG, Peng YU. Study of a consistent assembly system for AFM probes based on beam deflection method[J]. Optics and Precision Engineering, 2024, 32(2): 137
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Received: May. 10, 2023
Accepted: --
Published Online: Apr. 2, 2024
The Author Email: YU Peng (yupeng@sia.cn)