Acta Optica Sinica, Volume. 36, Issue 3, 331001(2016)

Theoretical Research on Volume Scattering of Thin Films with Single-Layer Columnar Structure

Wu Han1、*, Zhang Jinlong1, Li Gangzheng2, and Sun Yinghui2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(12)

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    [4] [4] Elson J M. Theory and Software for Light Scattering from Multilayer Optical Components with Interfacial Roughness[R]. Naval Air Warfare Center, Weapons Division, China Lake, CA, Technical Publication 8084, 1992.

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    [6] [6] Kassam S, Duparré A, Hehl K, et al.. Light scattering from the volume of optical thin films: theory and experiment[J]. Applied Optics, 1992, 31(9): 1304-1313.

    [7] [7] Maure S, Albrand G, Amra C. Low-level scattering and localized defects[J]. Applied Optics, 1996, 35(28): 5573-5582.

    [8] [8] Arnaud L, Georges G, Deumié C, et al.. Discrimination of surface and bulk scattering of arbitrary level based on angle-resolved ellipsometry: theoretical analysis[J]. Optics Communications, 2008, 281(6): 1739-1744.

    [10] [10] Thielsch R, Gatto A, Heber J, et al.. A comparative study of the UV optical and structural properties of SiO2, Al2O3, and HfO2 single layers deposited by reactive evaporation, ion-assisted deposition and plasma ion-assisted deposition[J]. Thin Solid Films, 2002, 410(1-2): 86- 93.

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    Wu Han, Zhang Jinlong, Li Gangzheng, Sun Yinghui. Theoretical Research on Volume Scattering of Thin Films with Single-Layer Columnar Structure[J]. Acta Optica Sinica, 2016, 36(3): 331001

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    Paper Information

    Category: Thin Films

    Received: Sep. 7, 2015

    Accepted: --

    Published Online: Mar. 3, 2016

    The Author Email: Han Wu (7wutong@tongji.edu.cn)

    DOI:10.3788/aos201636.0331001

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