Acta Optica Sinica, Volume. 30, Issue 10, 3044(2010)
Reliability Assessment of Superluminescent Diodes from Performance Degradation Data
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Chao Daihong, Ma Jing, Zhang Chunxi. Reliability Assessment of Superluminescent Diodes from Performance Degradation Data[J]. Acta Optica Sinica, 2010, 30(10): 3044
Paper Information
Category: Optical Devices
Received: Jan. 12, 2010
Accepted: --
Published Online: Oct. 24, 2012
The Author Email: Daihong Chao (daihongchao@vip.sina.com)
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