Microelectronics, Volume. 52, Issue 6, 1096(2022)

Study on Junction Temperature Measurement of GaN-Based LED

FENG Huiwei... RONG Yu, YE Sican, LIU Zhen, LU Ao, LI Jinxiao and YAN Dawei |Show fewer author(s)
Author Affiliations
  • [in Chinese]
  • show less
    References(10)

    [1] [1] LEE C T, YANG U Z, LEE C S, et al. White light emission of monolithic carbon-implanted InGaN-GaN light-emitting diodes [J]. IEEE Photonics Technol Lett, 2006, 18(19): 2029-2031.

    [2] [2] LAM K, LIN W, SHEI S, et al. White-light emission from gan-based TJ LEDs coated with red phosphor [J]. IEEE Elec Dev Lett, 2016, 37(9): 1150-1153.

    [3] [3] CHEN L C, HUANG Y L. High reliability GaN-based light-emitting diodes with photo-enhanced wet etching [J]. Sol Sta Elec, 2004, 48(7): 1239-1242.

    [4] [4] TEEBA N, YEW L K, KENG L C, et al. Study on the variation in thermal resistance and junction temperature of GaN based LEDs using thermal transient measurement [C]// Asia Symp Quality Elec Des. Kuala Lumpur, Malaysia. 2011: 310-314.

    [5] [5] YE H, CHEN X, ZEIJL H V, et al. Thermal transient effect and improved junction temperature measurement method in high-voltage light-emitting diodes [J]. IEEE Elec Dev Lett, 2013, 34(9): 1172-1174.

    [6] [6] HUANG X, XU Y, LIN W. A new method of LED junction temperature modeling and measurement [C]// China Int Forum Sol Sta Lighting. Beijing, China. 2016: 48-51.

    [7] [7] ABBING F D, PERTIJS M A. Light-emitting diode junction-temperature sensing using differential voltage/ current measurements [C]// IEEE Sensors. Limerick, Ireland. 2011: 861-864.

    [8] [8] XI Y, SCHUBERT E F. Junction-temperature measurement in GaN ultraviolet light-emitting diodes using diode forward voltage method [J]. Appl Phys Lett, 2004, 85(12): 2163-2165.

    [10] [10] TAO X, CHEN H, HUI S Y. Modeling of junction temperature and forward voltage of LED devices with externally measurable variables [C]// IEEE Energy Convers Congress Exposi. Raleigh, NC, USA. 2012: 4242-4245.

    [11] [11] Integrated circuit thermal measurement method-electrical test method (single semiconductor device): JESD51-1 [S]. JEDEC Sol Sta Technol Association, 1995.

    Tools

    Get Citation

    Copy Citation Text

    FENG Huiwei, RONG Yu, YE Sican, LIU Zhen, LU Ao, LI Jinxiao, YAN Dawei. Study on Junction Temperature Measurement of GaN-Based LED[J]. Microelectronics, 2022, 52(6): 1096

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Nov. 1, 2021

    Accepted: --

    Published Online: Mar. 11, 2023

    The Author Email:

    DOI:10.13911/j.cnki.1004-3365.210417

    Topics